This invited panel brings together experts to focus on the Xabilities analysis over multi-source data, modeling, and tasks in domains of static (off-line), dynamic (on-line), and usable (in-line) learning methods.
Attend this panel and learn from experts from around the world as they discuss the impact of comparative attributes of HOT III-V (T2SL and bulk) vs HOT HgCdTe.
Conference attendees are invited to attend the poster session on Tuesday evening. Come view the posters, enjoy light refreshments, ask questions, and network with colleagues in your field.
Join this panel discussion to learn about emerging topics in radar. This panel is a special joint session with the Radar Sensor Technology and Passive and Active Millimeter-Wave Imaging conferences.
