Paper 13093-194
Paper 13093-194
Zero residual stress determination of iridium/carbon bilayer and multilayer coatings by utilizing chromium
17 June 2024 • 17:30 - 19:00 Japan Standard Time | Room G5, North - 1F
Abstract
NewAthena (New Advanced Telescope for High-Energy Astrophysics) has been endorsed by the European Space Agency in November 2023 and the mission is entering a pre-industrialization phase prior to the foreseen adoption early 2027.
A key aspect of the thin film coating development for the NewAthena X-ray optics, is to determine the adhesion efficiency and the residual stress limitation of the coatings on silicon substrates. To do so, we magnetron sputtered different layer thicknesses of chromium layers underneath iridium/carbon bilayer and linear graded multilayer coatings.
The samples were characterized using X-ray Reflectometry (XRR) to derive the thickness, micro-roughness and densities. The residual stress was assessed by profilometry using a Dektak 150 stylus profiler device from Bruker. The curvature of the samples prior and post coating, along with the total film thickness derived from XRR, were used to evaluate the residual stress.
Presenter
DTU Space (Denmark), CHEXS ApS (Denmark)
I am a Special Consultant at DTU Space and co-founder of CHEXS ApS and have for more than 10 years worked with X-ray optics. I have an expertise in laboratory work, facility maintenance and characterization of mirror plate coatings. I finished my Ph.D. Degree in 2019 at DTU Space with a focus on industrialization of the thin films coatings for the Athena mission. Through my Ph.D. I developed skills in leadership, business and social relations by participating in the International Space University summer school in Australia and working abroad at a research and development company in the Netherlands. In 2019, I won the prize for the most outstanding Ph.D. Thesis in Danish Astronomy.