Impact of space ionizing environment on the warm front-end electronics flicker noise used for TES/SQUID readout

Space environment Ionizing particles could cause an increase of electronic flicker noise on a detection chain readout. We will present low frequency noise measurements of a readout subsystem and effect of total ionizing dose up to 100 krad obtained thanks to the irradiation of our electronics with 60Co source. We will discuss the impact on the noise readout of such radiation effects over the life-time of a space mission as ATHENA.