Assessing substrate quality and contamination of thin film coatings for x-ray optics

This work investigates the importance of substrate quality and contamination of thin film coatings, essential for high-energy mirrors used in astronomical missions and other applications, focusing on the manufacturing process from substrate production to final assembly of the optics. Characterization of thin film coatings is crucial for evaluating the performance of X-ray telescopes. A multifaceted and synergized methodology utilizing X-ray reflectivity (XRR), X-ray photoelectron spectroscopy (XPS) and optical microscopy (OM) is presented. Herein, we discuss coating performance, encompassing substrate preparation, coating deposition, and storage conditions.