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16 - 21 June 2024
Yokohama, Japan
Conference 13093 > Paper 13093-170
Paper 13093-170

Alignment verification of the X-IFU Focal Plane Assembly detector stage in warm and cold conditions

17 June 2024 • 17:30 - 19:00 Japan Standard Time | Room G5, North - 1F

Abstract

This work describes the alignment verification test program performed on the X ray Integral Field Unit Focal Plane Assembly (X-IFU FPA) Development Model (DM). The alignment of the detector stage with respect to the external interfaces in warm conditions is verified by mechanical measurements on a 3D measurement machine. In addition relative movement of the detector stage compared to the outer structure is monitored in 5 Degrees Of Freedom (DoF) during several thermal cycles. The acquired data is compared to mechanical models using a rigid body transformation description. Finally, these results are used in the alignment strategy within the X-IFU FPA using the available alignment budget estimates.

Presenter

SRON Netherlands Institute for Space Research (Netherlands)
Application tracks: Astrophotonics
Presenter/Author
SRON Netherlands Institute for Space Research (Netherlands)
Author
Auke Veninga
SRON Netherlands Institute for Space Research (Netherlands)
Author
Johannes P. C. Dercksen
SRON Netherlands Institute for Space Research (Netherlands)
Author
SRON Netherlands Institute for Space Research (Netherlands)
Author
SRON Netherlands Institute for Space Research (Netherlands)
Author
Emanuele Taralli
SRON Netherlands Institute for Space Research (Netherlands)
Author
SRON Netherlands Institute for Space Research (Netherlands)
Author
SRON Netherlands Institute for Space Research (Netherlands)
Author
Martin de Wit
SRON Netherlands Institute for Space Research (Netherlands)