ASIC design evolution of ATHENA X-IFU warm front-end electronics

This paper gives a review of the ASIC design evolutions of the WFEE in the context of the ATHENA mission. The development follows the evolutions of the X-IFU instrument detection chain and secures the ASIC technology access continuity by using an ST SiGe 130 nm technology instead of the previous use of an AMS SiGe 350 nm node. First ASIC prototypes based on this ST 130 nm SiGe technology have been developed to answer these technical challenges and meet the new requirements. This paper will give a brief review of these ASICs dedicated to the WFEE.