Share Email Print


Machine Vision Applications in Industrial Inspection XIV

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 6070
Date Published: 23 January 2006

Table of Contents
show all abstracts | hide all abstracts
Optical servoing for industrial surface machining
Author(s): Norbert Koller; Ronald Ofner; Paul O'Leary; Ewald Fauster
Show Abstract
Statistical learning with imbalanced training set in a machine vision application: improve the false alarm rate and sensitivity simultaneously
Author(s): Jonathan Qiang Li
Show Abstract
Boundary detection of projected fringes on surface with inhomogeneous reflectance function
Author(s): Jun Cheng; Ronald Chung; Edmund Y. Lam; Kenneth S. M. Fung; Fan Wang; W. H. Leung
Show Abstract
Height inspection of wafer bumps without explicit 3D reconstruction
Author(s): Mei Dong; Ronald Chung; Yang Zhao; Edmund Y. Lam
Show Abstract
Fast recognition method for metallic topographies by the three-color selective stereo gradient method
Author(s): Michael Hossfeld; Weiyi Chu; Manfred Eich; Markus Adameck
Show Abstract
Robustness of texture parameters for color texture analysis
Author(s): Ambroise Marin; David Connah; Audrey Roman; Jon Y. Hardeberg; Pierre Gouton
Show Abstract
Real-time multispectral imaging application for poultry safety inspection
Author(s): Bosoon Park; Kurt C. Lawrence; William R. Windham; Matthew P. Snead
Show Abstract
Flushing analysis by machine vision and fuzzy logic at molten steel for the automation process
Author(s): Christian Pfob; Kurt S. Niel; Roman Roessler
Show Abstract
Color influence on accuracy of 3D scanners based on structured light
Author(s): Sophie Voisin; David L. Page; Sebti Foufou; Frédéric Truchetet; Mongi A. Abidi
Show Abstract
Novel view synthesis for projective texture mapping on real 3D objects
Author(s): Thierry Molinier; David Fofi; Patrick Gorria
Show Abstract
3D translucent object reconstruction from artificial vision
Author(s): Frédéric Truchetet
Show Abstract
Real-time 3D wood panel surface measurement using laser triangulation and low-cost hardware
Author(s): Herbert Ramoser; Luigi Cambrini; Harald Rötzer
Show Abstract
Aerial platform attitude measurement by artificial vision
Author(s): F. Truchetet; O. Aubreton; P. Gorria; O. Laligant
Show Abstract
A new algorithm for real-time multi-stage image thresholding
Author(s): Siming Lin; Rob Giesen; Dinesh Nair
Show Abstract
Simultaneous photometric correction and defect detection in semiconductor manufacturing
Author(s): Yijiang Shen; Edmund Y. Lam
Show Abstract
Automatic mura detection system for liquid crystal display panels
Author(s): Li-Te Fang; Hsin-Chia Chen; I-Chieh Yin; Sheng-Jyh Wang; Chao-Hua Wen; Cheng-Hang Kuo
Show Abstract
New developments in image-based characterization of coated particle nuclear fuel
Author(s): Jeffery R. Price; Deniz Aykac; John D. Hunn; Andrew K. Kercher; Robert N, Morris
Show Abstract
Automatic monitoring and measuring vehicles by using image analysis
Author(s): Weixing Wang; Cui Bing
Show Abstract
Real-time detection of elliptic shapes for automated object recognition and object tracking
Author(s): Christian Teutsch; Dirk Berndt; Erik Trostmann; Michael Weber
Show Abstract
Discrete circles measurement for industrial inspection
Author(s): Fabrice Mairesse; Tadeusz Sliwa; Stéphane Binczak; Yvon Voisin
Show Abstract
Twin and scratch detection and removal in micrograph images of Inconel 718
Author(s): Gerhard Jakob; Alfred Rinnhofer; Horst Bischof; Wanda Benesova
Show Abstract
Tracking fluorescent spots in wide-field microscopy images
Author(s): Leila Mureşan; Bettina Heise; Erich Peter Klement
Show Abstract
Development of methods based on double Hough transform or Gabor filtering to discriminate between crop and weed in agronomic images
Author(s): Jérémie Bossu; Christelle Gée; Jean-Philippe Guillemin; Frédéric Truchetet
Show Abstract
An active contour algorithm for detecting the circular features in a PCB x-ray image
Author(s): Yung-Sheng Chen; Chia-Hao Wu; Wen-Fong Hu
Show Abstract
Human vision based detection of non-uniform brightness on LCD panels
Author(s): Jee Hong Kim; Brian A. Barsky
Show Abstract
Optimized texture classification by using hierarchical complex network measurements
Author(s): T. Chalumeau; L. da F. Costa; O. Laligant; F. Meriaudeau
Show Abstract
A refined range image registration technique for multi-stripe laser scanner
Author(s): Carles Matabosch; Joaquim Salvi; David Fofi; Fabrice Meriaudeau
Show Abstract
Surface orientation recovery of specular micro-surface via binary pattern projection
Author(s): Zhan Song; Ronald Chung; Jun Cheng; Edmund Y. Lam
Show Abstract
Constructing a simple parametric model of shoulder from medical images
Author(s): H. Atmani; D. Fofi; F. Merienne; P. Trouilloud
Show Abstract

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?