Bijl, Piet

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Dr. Piet Bijl

Senior Research Scientist
TNO Defence Safety & Security
Fellow Member

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Area of Expertise: human vision, psychophysics, sensor performance, electro-optics, target acquisition, thermal imagers
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Piet Bijl currently works as a programme leader and senior specialist at the Perceptual & Cognitive Systems Department of TNO Behavioural and Societal Sciences in The Netherlands. He received his Ph.D. in physics from the University of Utrecht in The Netherlands in 1991. Research experience includes Target Acquisition, psychophysics, visual contrast detection, object recognition and visual search, and characterization of optical and electro-optical (E/O) system performance with the human-in-the-loop. He developed the (patented) TOD test method to quantify E/O system performance for staring array and scanning camera systems including CCD cameras, thermal imagers and X-ray screening systems. He has published over 60 articles and TNO reports on these topics. He is involved in developing test procedures for complex imaging systems, including multi-band systems and systems with image enhancement or compression techniques and in the development of new standard video and thermal camera system performance specification methodologies. He is Program Committee Member of the DSS symposium on Infrared Imaging Systems; Design, Analysis, Modeling, and Testing, Member of NATO JCGISR Team of Experts Electro Optics working on STANAG 4347-4351 updates, Member of an international committee on the characterization of complex imaging systems, Guest Editor of the Optical Engineering journal, and was Topical Editor of the Psychophysics Section of the Marcel Dekker Encyclopedia of Optical Engineering. For his contributions in the field of Electro-Optics he was elected Fellow of SPIE in 2010.
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