Dr. Piet Bijl

Fellow Member | Senior Research Scientist at TNO Defence Safety & Security
Bijl, Piet
SPIE Leadership: Retrieving Data, please wait...
SPIE Membership: 16.5 years total | 16.5 years voting
SPIE Awards: Fellow status
SPIE Involvement: Retrieving Data, please wait...
Area of Expertise: human vision, psychophysics, sensor performance, electro-optics, target acquisition, thermal imagers
Websites: Company Website
Contact Details:
Sign In to send a private message or view contact details

Profile Summary

Piet Bijl currently works as a programme leader and senior specialist at the Perceptual & Cognitive Systems Department of TNO Behavioural and Societal Sciences in The Netherlands. He received his Ph.D. in physics from the University of Utrecht in The Netherlands in 1991. Research experience includes Target Acquisition, psychophysics, visual contrast detection, object recognition and visual search, and characterization of optical and electro-optical (E/O) system performance with the human-in-the-loop. He developed the (patented) TOD test method to quantify E/O system performance for staring array and scanning camera systems including CCD cameras, thermal imagers and X-ray screening systems. He has published over 60 articles and TNO reports on these topics. He is involved in developing test procedures for complex imaging systems, including multi-band systems and systems with image enhancement or compression techniques and in the development of new standard video and thermal camera system performance specification methodologies. He is Program Committee Member of the DSS symposium on Infrared Imaging Systems; Design, Analysis, Modeling, and Testing, Member of NATO JCGISR Team of Experts Electro Optics working on STANAG 4347-4351 updates, Member of an international committee on the characterization of complex imaging systems, Guest Editor of the Optical Engineering journal, and was Topical Editor of the Psychophysics Section of the Marcel Dekker Encyclopedia of Optical Engineering. For his contributions in the field of Electro-Optics he was elected Fellow of SPIE in 2010.

SPIE Volunteer Activities

Retrieving Data, please wait...

Upcoming Presentations

Most Recent | Show All
Retrieving Data, please wait...

Publications

Most Recent | Show All
Retrieving Data, please wait...

Conference Committee Involvement

Most Recent | Show All
Retrieving Data, please wait...

Course Instructor

Most Recent | Show All
Retrieving Data, please wait...
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?
close_icon_gray