Paul C. Knutrud

Expertise in Systems Application, Engineering and Product Management of Semiconductor Optical Metrology Systems.

US Patent # 6,612,159 B1, Taiwan Patent NI-163761, Sole Author, “Overlay registration error measurement made simultaneously for more than two semiconductor wafer layers.”

US Patent #10,445,889 b2, Sole Author, “Method of measuring offset in an integrated circuit and related technology” (Diamond Algorithm) to provide better repeatability and TIS on Box in Box overlay structures