Share Email Print

Proceedings Paper

A fiber optic-film temperature sensor taking advantage of thermal optical effect as well as temperature-dependent absorption of semiconductor
Author(s): Min Li; Yulin Li
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

After several decades, the development and application of absorptive fiber semiconductor temperature sensor have been slowed down for the difficulty to satisfy the critical requirement of the special wavelength and broadband lightsource. On the other hand, temperature-dependent refractive index, i.e., thermal-optic effect of the semiconductor materials has not gained much attention beyond the semiconductor processing industry. With a much larger temperature-dependent refractive index than the common optical materials, such as glass and quartz, many semiconductor are also popular coating materials on fiber. Taking advantage of the interaction of large temperature-dependent refractive index and temperature-dependant absorption coefficient of semiconductor, we manage to build a very small, sensitive, simple and low cost fiber temperature probe operating at communication wavelength. We develop a sensor model for an optical fiber-germanium (Ge) film type temperature sensor based on the modified optical film theory, which involves temperature-dependent absorption below infrared transparent window of Ge as second major cause for reflectivity change beside thermal optical effect. Investigation of the feasibility and sensitivity of the fiber-film probe has been carried out theoretically and experimentally within the temperature regime of -20-120°C, which is the most used temperature range for industry monitoring. A sensitivity of reflectivity change about 0.001/°C has been demonstrated by the experimental results of the novel designed sensor. Further discussion on the potential of sensitivity and further application are presented.

Paper Details

Date Published: 9 November 2010
PDF: 8 pages
Proc. SPIE 7853, Advanced Sensor Systems and Applications IV, 78530W (9 November 2010); doi: 10.1117/12.867461
Show Author Affiliations
Min Li, Wuhan Univ. of Technology (China)
Yulin Li, Wuhan Photon Science and Technology Inc. (China)

Published in SPIE Proceedings Vol. 7853:
Advanced Sensor Systems and Applications IV
Brian Culshaw; Yanbiao Liao; Anbo Wang; Xiaoyi Bao; Xudong Fan; Lin Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?