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Proceedings Paper

Influence of temperature-dependent refractive index on thermal radiation from surface gratings
Author(s): Hiroo Yugami; Takahiro Kamikawa; Yoshiaki Kanamori
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Paper Abstract

We set up a high-temperature ellipsometry system for the measurement of optical constants n and k. The n and k values of refractory metals of W and Mo were measured from the visible (VIS) to near infrared (NIR) wavelength range at several temperatures by means of the system. The n drastically increases especially in the NIR region, while the k is almost invariant in all the range with increasing temperatures. Numerical simulation based on rigorous coupled-wave analysis (RCWA) with the values of n and k measured by high-temperature ellipsometry is qualitatively coincident with the measured spectral emissivity at high temperature. It has revealed that spectral emissivity has temperature dependence especially in the NIR region.

Paper Details

Date Published: 12 May 2006
PDF: 9 pages
Proc. SPIE 6197, Photonics for Solar Energy Systems, 61970W (12 May 2006); doi: 10.1117/12.662760
Show Author Affiliations
Hiroo Yugami, Tohoku Univ. (Japan)
Takahiro Kamikawa, Tohoku Univ. (Japan)
Yoshiaki Kanamori, Tohoku Univ. (Japan)

Published in SPIE Proceedings Vol. 6197:
Photonics for Solar Energy Systems
Andreas Gombert, Editor(s)

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