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Proceedings Paper

Dammann grating design for quasi-phase matched multiple nonlinear optical interactions
Author(s): Adrián J. Torregrosa; Carlos R. Fernández-Pousa; Juan Capmany
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Paper Abstract

We propose the use of Dammann gratings commonly applied to problems in diffractive optics as a flexible tool for practical design of devices which perform multiple nonlinear optical frequency conversion processes, and which exhibit a bandpass grid-like quasiphase matched response in the wavevector mismatch space (Δk). By designing a periodic structure where several inversions in the sign of the nonlinear figure of merit take place at strategic locations within a fundamental period, baseband grid-like responses can be achieved in nonlinear materials consisting of sharp quasihase matching (QPM) peaks equally spaced in the wavevector mismatch space around Δk=0. With this design tool, the relative efficiency of the individual peaks in the grid can be arbitrarily set (equalization), including targeted suppression of specific nonlinear interactions in the grid (channel suppression). The baseband gratings so designed are then reallocated in Δk space by superimposing the baseband design on a suitable square carrier to achieve a targeted band-pass response. We present a simple procedure for the design of both baseband and bandpass Dammann gratings with examples of equalization and suppression in the context of nonlinear optics based on optimization algorithms. The tolerance of the designs under random variations of the inversion points and design quality parameters are also discussed.

Paper Details

Date Published: 5 October 2005
PDF: 10 pages
Proc. SPIE 5949, Nonlinear Optics Applications, 59491A (5 October 2005); doi: 10.1117/12.623155
Show Author Affiliations
Adrián J. Torregrosa, Univ. Miguel Hernández (Spain)
Carlos R. Fernández-Pousa, Univ. Miguel Hernández (Spain)
Juan Capmany, Univ. Miguel Hernández (Spain)

Published in SPIE Proceedings Vol. 5949:
Nonlinear Optics Applications
Miroslaw A. Karpierz; Allan Dawson Boardman; George I. Stegeman, Editor(s)

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