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Proceedings Paper

Chip-scale high-performance digital Fourier Transform (dFT) spectrometers
Author(s): Derek M. Kita; Brando Miranda; Carlos Ríos; David Favela; David Bono; Jérôme Michon; Hongtao Lin; Tian Gu; Juejun Hu
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Paper Abstract

On-chip spectrometers have recently emerged as a promising alternative to conventional benchtop instruments with apparent Size, Weight, and Power (SWaP) advantages for applications including spectroscopic sensing, optical network performance monitoring, RF spectrum analysis, optical coherence tomography, and hyperspectral imaging. Existing onchip spectrometer designs, however, are limited in spectral channel count and signal-to-noise ratio (SNR). Here we demonstrate a transformative on-chip digital Fourier transform (dFT) spectrometer that can acquire high-resolution spectra via time-domain modulation of a reconfigurable Mach-Zehnder interferometer. The device, fabricated and packaged using industry-standard silicon photonics technology, claims the multiplex advantage to dramatically boost SNR and unprecedented scalability capable of addressing exponentially increasing numbers of spectral channels. We further explored and implemented machine learning regularization techniques to spectrum reconstruction. Using an ‘elastic-D1’ regularized regression method that we developed, we achieved significant noise suppression for both broad (> 600 GHz) and narrow (< 25 GHz) spectral features, as well as spectral resolution enhancement beyond the classical Rayleigh criterion. The dFT architecture and spectrum reconstruction techniques demonstrated in this work will drive future work in on-chip optical spectroscopy and enable practical realizations of high-performance chip-scale spectrometers with large (> 1,000) spectral channel counts.

Paper Details

Date Published: 13 May 2019
PDF: 7 pages
Proc. SPIE 10983, Next-Generation Spectroscopic Technologies XII, 1098306 (13 May 2019); doi: 10.1117/12.2518437
Show Author Affiliations
Derek M. Kita, Massachusetts Institute of Technology (United States)
Brando Miranda, Massachusetts Institute of Technology (United States)
Carlos Ríos, Massachusetts Institute of Technology (United States)
David Favela, Massachusetts Institute of Technology (United States)
David Bono, Massachusetts Institute of Technology (United States)
Jérôme Michon, Massachusetts Institute of Technology (United States)
Hongtao Lin, Massachusetts Institute of Technology (United States)
Tian Gu, Massachusetts Institute of Technology (United States)
Juejun Hu, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 10983:
Next-Generation Spectroscopic Technologies XII
Richard A. Crocombe; Luisa T.M. Profeta; Abul K. Azad, Editor(s)

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