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Proceedings Paper

The effect of near-infrared laser beam on the surface modification of metal complex based on 3D laser scanning system
Author(s): Mali Zhao; Tiegen Liu; Junfeng Jiang; Meng Wang
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Paper Abstract

High-precision 3-dimensional metallization is difficult to realize in specific nonmetallic areas by using the traditional methods such as wet-chemical and mechanical methods because of the disadvantage that usually they cannot achieve selective modification. In this paper, 3-dimensional laser scanning system was applied to achieve the modification of specific regions of the sample surface. In 3-dimensional laser scanning system, the laser beam, after going through dynamic focusing system, was reflected by galvanometers and then focused by f-theta lens on the sample surface. The changes in surface characteristics of the blends of polycarbonate and acrylonitrile butadiene styrene copolymers (PC/ABS) mixed with Cu-Cr complex by the laser irradiation with the wavelength of 1064nm were investigated. Through analysis it was found that the smooth surface of the original samples was changed to a micro-hole structure accompanied by an increased surface roughness as well as an increased water contact angle. The chemical composition percentage had changed and the metal components of copper and chromium were detected after the laser irradiation. The irradiated areas were degraded into organic ligand fragments, volatile gas and reducing metal ions of copper and chromium. Besides, the thickness of the deposited metal layer and the adhesive force between the metal layer and the substrate after electroless plating varied according to the laser parameters such as frequency and scanning speed. As shown in the experiment, the thickness of deposited copper layer exceeded 11μm and the deposited nickel layer exceeded 2μm respectively.

Paper Details

Date Published: 17 November 2014
PDF: 8 pages
Proc. SPIE 9274, Advanced Sensor Systems and Applications VI, 927425 (17 November 2014); doi: 10.1117/12.2074626
Show Author Affiliations
Mali Zhao, Tianjin Univ. (China)
Key Lab. of Opto-electronics Information Technology (China)
Tiegen Liu, Tianjin Univ. (China)
Key Lab. of Opto-electronics Information Technology (China)
Junfeng Jiang, Tianjin Univ. (China)
Key Lab. of Opto-electronics Information Technology (China)
Meng Wang, Nankai Univ. (China)

Published in SPIE Proceedings Vol. 9274:
Advanced Sensor Systems and Applications VI
Tiegen Liu; Shibin Jiang; Niels Neumann, Editor(s)

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