SPIE Profiles

SPIE Profiles is an optics and photonics networking platform for professionals

Explore SPIE Profiles

Dr. Andreas Erdmann
Fraunhofer IISB
Fellow Member
Dr. Peter Takacs
Surface Metrology Solutions LLC
Fellow Member
Prof. Mark Stockman
Georgia State Univ
Fellow Member
Prof. Qiwen  Zhan
Univ of Dayton
Fellow Member
Dr. Andreas Wartak
Harvard Medical School
Individual Member
Dr. Hans Loeschner
IMS Nanofabrication GmbH
Individual Member

Get access to all the features on SPIE Profiles

Sign in to your SPIE Account

Send messages, follow, and view contact details
Email (or username)

Create your own SPIE Profile

Sign up with a free account. You will be able to:
  • Manage your SPIE information
  • Stand out in the SPIE Conference app
  • See your activity with the Society
  • Message other Profiles users
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?