SPIE Profiles

SPIE Profiles is an optics and photonics networking platform for professionals

Dr. Young Seog Kang SAMSUNG Electronics Co Ltd Individual Member	Dr. E. Brian Welch Vanderbilt Univ Institute of Imaging Science Senior Member	Prof. Amy Lynn Oldenburg Univ of North Carolina at Chapel Hill Fellow Member
Varun Mannam Univ of Notre Dame Student Member	Prof. Lukas Chrostowski Univ of British Columbia Individual Member	Dr. Patrick La Rivière Univ of Chicago Fellow Member

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