Dr. Sherif Sayed Ahmed

Senior Development Engineer at Rohde & Schwarz GmbH & Co KG
Ahmed, Sherif Sayed
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SPIE Membership: 8.9 years total | 7.9 years voting
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Area of Expertise: Microwave imaging, Millimeter-Waves, Remote Sensing, THz Imaging
Websites: Company Website
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Profile Summary

Sherif Sayed Ahmed received the B.Sc. degree with honor in Electronics and Communication Engineering from Cairo University, Cairo, Egypt, in 2004, and the M.Sc. degree in Microwave Engineering from the Technische Universität München, Munich, Germany, in 2007.

From 2008 to 2010, he was a researcher in the Institute of Microwaves and Photonics, University of Erlangen-Nuremberg, Erlangen, Germany, where he conducted his doctoral study in the field of microwave and millimeter-wave imaging technologies in a close collaboration with Rohde & Schwarz in Munich, Germany. He has coauthored several conference and journal papers on the topic of microwave imaging systems. He is currently with Rohde & Schwarz, where he is involved in the research and development in the fields related to near-field imaging systems, stand-off imaging systems, multistatic radar, advanced signal-processing techniques, terahertz technology, low phase noise oscillators, and numerical electromagnetics.

Mr. Ahmed was the recipient of the University Academic Award of the Technische Universität München in 2007, and the Innovation Award of Rohde & Schwarz in 2009.

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