Prof. Uzodinma Okoroanyanwu

Fellow Member | Research Associate Professor at University of Massachusetts Amherst
Okoroanyanwu, Uzodinma
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SPIE Membership: 21.6 years
SPIE Awards: Fellow status | Senior status
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Area of Expertise: Lithography, Electrochemical energy storage, Printed & flexible electronics
Websites: Company Website
Social Media: LinkedIn
ORCID iD: https://orcid.org/0000-0001-6271-9705
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Profile Summary

Uzodinma Okoroanyanwu, a research associate professor in the department of polymer science and engineering of University of Massachusetts at Amherst, conducts research aimed at developing functional materials, patterning methods, and devices used in electrochemical energy storage; chemical sensing; printed, flexible, flexible/hybrid and wearable electronics; and electromagnetic interference shielding. He is the founder of Enx Labs, a company that translates some of his research results into devices and instruments that help to improve the human condition and sustain the environment. He worked previously at Advanced Micro Devices, where he spent 12 years conducting research on advanced lithography and on organic polymer memories, and at GLOBALFOUNDRIES, where he spent 4 years conducting research on advanced lithography. He is the author of several books, including Chemistry and Lithography (SPIE Press & John-Wiley & Sons, 2010), Molecular Theory of Lithography (SPIE Press, 2015); Chemistry and Lithography, 2nd ed., Vol. 1: The Chemical History of Lithography (SPIE Press, 2020); and most recently, Chemistry and Lithography, 2nd ed., Vol. 2: Chemistry in Lithography (SPIE Press, 2023). A holder of 37 U.S patents, he was educated at The University of Texas at Austin, where he earned the following degrees: Ph.D. physical chemistry (1997), M.S. chemical engineering (1995), M.A. physical chemistry (1994), B.S. Chemistry and Chemical engineering (1991). He is a fellow of SPIE, the international society for optics and photonics, as well as an associate editor of the Journal of Micro/Nanopatterning, Materials, and Metrology.

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