Dr. Pierre M. Boher

Pierre Boher earned an Engineer degree at the ECP (Ecole Centrale des Arts et Manufactures) in 1982. After earning his Ph.D. in material sciences in 1984, he worked in the French Philips Laboratories during nine years on the deposition and characterization of very thin films and multilayers. R&D manager at SOPRA between 1995 and 2002, he participates to the development of different metrology tools for non destructive characterization mainly for microelectronics. He joined ELDIM in 2003 to be involved in the research and development of new metrology heads.