Dr. Peter Z. Takacs

Fellow Member | Physicist Emeritus at Surface Metrology Solutions LLC
Takacs, Peter Z.
SPIE Membership: 23.8 years total | 23.8 years voting
SPIE Awards: Fellow status
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Area of Expertise: optical metrology, surface profilometry, MTF of CCDs
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Profile Summary

Peter Z. Takacs directs the activities of the Optical Metrology Laboratory in the Instrumentation Division of Brookhaven National Laboratory. He is actively involved in the development of instrumentation, methods, and standards used for testing the figure and finish of aspheric optics, such as those used for reflecting x-rays at grazing incidence, and in characterizing the performance of CCD sensors He received a BA from Rutgers University in 1969 and a PhD in physics from Johns Hopkins University in 1975.

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