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Dr. Noël M. Ziebarth
Assistant Professor
at Univ or Miami
SPIE Leadership:
Retrieving Data, please wait...
SPIE Membership:
1.0 years
SPIE Involvement:
Retrieving Data, please wait...
Area of Expertise:
Atomic Force Microscopy
,
imaging with AFM, SEM, eSEM
,
mechanical property measurement
,
ophthalmic applications
Websites:
Company Website
Contact Details:
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