Dr. Myungjun Lee

Myungjun Lee is the head of Metrology and Inspection team at Samsung Electronics, leading the development of the current & next-generation metrology and inspection solutions needed for semiconductor chip manufacturing. Prior to joining Samsung in 2017, he worked for several companies including KLA-Tencor, Strategic Lithography Team at GlobalFoundries (Also, pathfinding patterning team at IBM, Albany, NY), and Nanometrics to develop various patterning and metrology solutions.

Dr. Lee received his Ph.D degree in electrical computer engineering/optical science from University of Arizona (under Prof. Mark A. Neifeld) in 2010, a master degree from Texas A&M University (under Prof. Henry F. Taylor) in 2005, and a bachelor degree from Korea University in 2002. From 2010 to 2011, he was a postdoctoral fellow in Electrical Engineering department at UCLA working on computational imaging techniques under Prof. Aydogan Ozcan.

He has authored/co-authored 60+ journal and conference papers, and holds 40+ US patents in various optical system designs and their applications for imaging, sensing, communications, semiconductor patterning and metrology.