Dr. Juan J. Faria-Briceno

Early Career Professional Member | Post Doctoral Fellow at CHTM - University of New Mexico
Faria-Briceno, Juan J.
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SPIE Membership: 0.9 years total | 0.0 years voting
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Area of Expertise: In/Off line Metrology , Optical Scatterometry, Nano Manufacturing , Roll-to-roll fabrication, Nano fluidics
ORCID iD: https://orcid.org/0000-0002-5612-7559
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Profile Summary

Dr. Faria-Briceno received his B.S. degree in Electrical and Computer Engineering with University Honors (Cum Laude) in 2015. Dr. Faria-Briceno is a Ronald E. McNair/ROP fellow having participated in the program in 2013-2014. Dr. Faria-Briceno earned two Master of Science degrees: Optoelectronics with the Electrical and Computer Engineering Department and Photonics Optical Science and Engineering). Dr. Faria-Briceno earned a PhD in Optoelectronics (Electrical and Computer Engineering) with Dissertation Honors in which he was fully funded by a National Science Foundation - Engineering Research Center (NSF-ERC NASCENT) developing technologies for Nanomanufacturing process. Dr. Faria-Briceno’s research focuses on designing new alternative metrology systems for R2R manufacturing process (dissertation titled “Optical Angular Scatterometry for In-line R2R Manufacturing). His work has been published in the refereed Journals: JVST-B, AIP, and Nature-Scientific Reports and presented at national/international conferences.

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