Dr. Jovan G. Brankov

Individual Member | Professor at Illinois Institute of Technology
Brankov, Jovan G.
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SPIE Membership: 10.9 years total | 10.9 years voting
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Area of Expertise: phase contrast imaging, image quality assessment, model observer, image processing, machine learning
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Profile Summary

Dr. Brankov joined the Electrical and Computer Engineering Department at the Illinois Institute of Technology in 2002 as a researcher, in 2004 he was promoted to Research Assistant Professor and in 2008 appointed as Assistant Professor. His research interests include medical imaging, image sequence processing, pattern recognition and data mining. His research emphasis on reconstruction, restoration, analysis (e.g. motion tracking, segmentation, tumor detection), recognition and images acquisition, especially for biomedical applications. His current research topics include: medical image quality assessment based on a human-observer model, multiple-image radiography (a new phase-sensitive x-ray imaging method), 4D and 5D tomographic image reconstruction methods for medical image sequences and high-performance computing using Graphics Processing Unit (GPU). He established the Advanced X-ray Imaging Laboratory (AXIL) at IIT, which is currently developing a phase-sensitive x-ray device.
He is author/co-author of 100 publications, 2 technical reports and a book chapter. His is currently serving as: associate editor for IEEE Transactions on Medical Imaging, Medical Physics (AAPM) and Journal of Electronic Imaging (SPIE and IS&T), program committee member for IEEE International Symposium on Biomedical Imaging and SPIE Image Perception conferences and associate member of BioImaging and Signal Processing (BISP) Technical Committee of the IEEE Signal Processing Society. He is a member of SPIE, Sigma Xi and senior member of IEEE technical communities.

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