Dr. Jangho Shin

Senior Member | Manager, Senior Field Apps Engineer

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SPIE Membership:	17.0 years
SPIE Awards:	Senior status
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Area of Expertise:	Semiconductor Processing, Optical Lithography, Alignment, Overlay Metrology, Computational lithography, Defect inspection metrology

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Profile Summary

Jangho (Jerry) Shin is presently a senior manager of field apps engineering at ASML Korea. He was a researcher/manager at Samsung semiconductor R&D and is a Senior member of SPIE. Dr. Shin received his PhD in electrical and computer engineering from the University of Wisconsin at Madison in 2003.

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