born 30.09.1961 Berlin,
1982-1987 Physics studies at TU Dresden, graduated with a work on x-ray fluorescence analysis, 1987-1991 working on x-ray detectors at the Centre for scientific instrumentation of the Academy of Sciences, since 1991 with the X-ray radiometry laboratory of PTB at BESSY 1997 PhD at TU Berlin, internal quantum yield of silicon in the soft X-ray spectral range working on EUV and soft x-ray detector calibration and optical components characterization, development of measurement methods for the characterization of components for EUV Lithography and x-ray scattering methods for the characterization of structured surfaces. Head of the working group for EUV radiometry.
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