Dr. Andreas Süss

Sr. Manager at OMNIVISION Technologies, Inc
Süss, Andreas
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SPIE Membership: 4.0 years
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Area of Expertise: Image Sensors, Mixed-Signal Circuit Design, Calibration of PM ToF Imagers, Puled Modulated (PM) Time-of-Flight (ToF) Imaging, Noise Modelling, Characterization and Minimization in Devices, Circuits up to entire Imagers, Solid State Devices
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Profile Summary

Andreas Süss received the B.Sc. from the Univ. of Applied Sciences Düsseldorf in 2008 and Ph.D. degree from Univ. Duisburg-Essen in 2014. From 2007 until 2014 he was with Fraunhofer Institute IMS where he was mainly working on high-speed, low-noise imagers for e.g. ToF applications. From 2014 until 2015 he had a scholarship from the KU Leuven and worked as a postdoctoral researcher on global shutter imaging at the MICAS department in collaboration with IMEC, Leuven. As of 2015 he is hired as an R&D engineer in the IMEC imaging division, where he is currently responsible for the pixel development for global shutter and high-speed applications. His research interests include modeling, temporal noise, optimization, compressed sensing and depth imaging.

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