Zeev Zalevsky: The 2023 SPIE Chandra S. Vikram Award in Optical Metrology

The SPIE Chandra S. Vikram Award in Optical Metrology recognizes exceptional contributions to the field of optical metrology, whether for a specific achievement, development, or invention of significance, or for lifetime achievement
11 January 2023
Zeev Zalevsky in his lab, working with a setup doing super resolved imaging in silicon.
Zalevsky in his lab, working with a setup doing super resolved imaging in silicon.

Professor and Dean of Engineering at Bar-Ilan University Zeev Zalevsky’s primary areas of research focus on optical super resolution, biomedical optics, holography, nano-photonics, and fiber-based processing and sensing architectures. He has also made important contributions to the fields of Fourier optics. As a postdoc, Zalevsky collaborated with Chandra Vikram in the field of holography, and wrote the chapter entitled “Holography and Structured Illumination for Super Resolved Imaging” in the Vikram-edited book New Directions in Holography and Speckle. Since receiving his doctorate in electrical engineering from Tel Aviv University in 1996, Zalevsky has founded multiple optical startups. Through his commercial enterprises, he has developed a next-generation remote biosensor for vital signs, a disposable ultra-thin endoscope, special optical fibers for communication networks and medical diagnoses, and more. In recognition of his research, Zalevsky has received many national and international awards, including the Krill Prize, the International Commission for Optics (ICO) Prize, the Erlangen Graduate School in Advanced Optical Technologies (SAOT) Young Researcher Award, and an IS&T Image Engineering Innovation Award.

Zalevsky, an SPIE Fellow, has been the editor-in-chief of the Journal of Electronic Imaging, co-published by SPIE and the Society for Imaging Science and Technology, since 2021. He is a past SPIE Prism Award winner (2018), and an SPIE Startup Challenge winner (2017). He serves on the SPIE conference program committees for Optical Systems Design, Optical Metrology, Defense + Commercial Sensing, and BiOS. He is also an instructor for the SPIE course “Super Resolution and Extended Depth of Focus.” As an instructor and mentor, he has supervised more than 100 MA and PhD students and has guided more than 100 undergraduates through their final projects in engineering.

“One of the technologies Professor Zalevsky is honored for is a laser-based, remote bio-sensor,” notes Pietro Ferraro, director of Research at the National Research Council of Italy’s Institute of Applied Sciences and Intelligent Systems. “This technology was invented in the research labs of Professor Zalevsky and, after 10 years of research, commercialized to a startup company called Donisi Health. As an outcome of the research activity conducted, about 50 peer review papers, many proceedings papers, and 26 granted patents were published about this new type of sensing technique. What is revolutionary in the scientific contribution of Professor Zalevsky is that the invented sensing mechanism allows
medical-grade sensing simultaneously and continuously and, most important, in an agnostic manner, i.e., without affecting or interfering with the lifestyle or the natural in-home activity of the subjects.”

Meet the other 2023 SPIE Society Award recipients.

Read more about Zeev Zalevsky and the SPIE Chandra S. Vikram Award in Optical Metrology.

 

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