Chandra S. Vikram Award

SPIE Fellow Mitsuo Takeda, a professor at Utsunomiya University (Japan), is the 2017 recipient of the SPIE Chandra S. Vikram Award in Optical Metrology. He is honored for the invention of the Fourier transform method of interferogram fringe analysis, achievements in coherence holography, and many industrial applications of three-dimensional shape measurements.

“During more than 30 years of his career in the field of holography and optical metrology, Prof. Takeda has done a lot of innovative work,” said SPIE Fellow Christophe Gorecki of the Institut FEMTO-ST in France. “His pioneering work in the development and the establishment of Fourier fringe analysis is extremely important. His contributions are interdisciplinary and international, encompassing a broad area of optical science and technology, and have a large impact.”

Takeda is among the most recognized experts in full-field optical metrology. He is the author of more than 120 journal papers, nearly 50 invited papers, 10 review papers, seven book chapters, and nearly 20 patents. He has also given 13 plenary and keynote presentations. The 1982 paper he coauthored, “Fourier transform method of fringe pattern analysis for computer based topography and interferometry,” has surpassed 2500 citations, according to Web of Science.

He has continued his research in the field of optical metrology, with emphasis on basic principles and industrial applications of optical interferometry, coherent and incoherent light holography, and profilometry. His particular focus is on fringe pattern analysis and image/optical information processing.

His sequential papers on application of Fourier transforms for automatic measurement of 3D object shape, including objects with large height steps and surface isolations, have received nearly 1400 citations. Combined with the 1982 paper, Takeda’s work makes up the essential core of full-field optical metrology and related techniques.

Takeda is one of the most innovative and productive scientists in modern optics, said Wolfgang Osten, a member of the SPIE Board of Directors and head of the Institute of Applied Optics at the University of Stuttgart (Germany). “His publication record is very large. However, in his case, quantity and quality are in a well-balanced relation. Several of his publications have stimulated new research fields and motivated many scientists for their own work.”

The SPIE Chandra S. Vikram Award in Optical Metrology is given annually for exceptional contribution to the field of optical metrology. The award may be presented for a specific achievement, development, or invention of significant importance to optical metrology or may be given for lifetime achievement.

SPIE ANNUAL AWARD NOMINATIONS

Members of the photonics community may nominate colleagues for a 2018 SPIE award to recognize their outstanding achievements. Nominations may be made through 24 June 2018 and are considered active for three years from the submission date.

Read more about SPIE awards. 

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