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Gambling with chips: New metrology tools reduce the odds for error in electronic devices

Advanced metrology methods are needed to find lithography errors on ever-shrinking semiconductor devices

Gambling with chips: New metrology tools reduce the odds for error in electronic devices

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Can lithography help save the planet?

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SPIE Fellow and cine lens designer Iain Neil wins an Oscar for lifetime achievement

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Emerging research opportunities in living multifunctional materials

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Multiphoton microscopy: A growing — and diversifying — area of critical science

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Seeing further than before: This year’s BiOS Hot Topics are real eye-openers

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Deep learning: A powerful tool for biophotonics in labs and clinics

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Cherenkov color imaging shows promise in enhancing radiation therapy effectiveness

High-speed super-resolution microscopy via temporal compression

AI can help optimize CT scan X-ray radiation dose

Solving etch challenges in EUV patterning

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