Past Event Overview

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SPIE Scanning Microscopy 2010, a multidisciplinary forum seeking to advance scanning microscopy technologies and applications.

2010 Program Sessions at a Glance

Over 75 presentations in these areas:

 •Particle Beam Microscopy
 •Forensics Microscopy
 •Scanned Probe Modeling
 •Optical Microscopy
 •Microscopy for Food Analysis
 •Biological Scanning Microscopy

Workshops:

 •Desk Top SEM
 •Forensics

SPIE Scanning Microscopy 2010
The conference for scientists and researchers to share ideas and find technical solutions, funding sources, and personal connections that help ensure their success.

Thank you to the SPIE Scanning Microscopy Organizers

 

Michael T. Postek, National Institute of Standards and Technology (USA)

 

S. Frank Platek, U.S. Food and Drug Administration (USA)

 

Dale E. Newbury, National Institute of Standards and Technology (USA)

 

David C. Joy, The Univ. of Tennessee (USA)