26 - 29 June 2023
Munich, Germany
Technology being presented at SPIE Optical Metrology

Optical Metrology technical conferences

Come ready to discuss the latest research in measurement systems, modeling, videometrics, and inspection

Featuring six technical conferences

Thank you to our 2023 Optical Metrology Chairs

Marc P. Georges

Univ. de Liège (Belgium)

Jörg Seewig

Technische Univ. Kaiserslautern (Germany)

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Access the research you need

Presentations and manuscripts presented at Optical Metrology are published in the Proceedings of SPIE on the SPIE Digital Library.