23 - 26 June 2025
Munich, Germany

SPIE Optical Metrology Technical Conferences

The premier European conference for scientists, engineers, researchers, and product developers
Technology being presented at SPIE Optical Metrology

Optical Metrology technical conferences

Come ready to discuss the latest research in measurement systems, modeling, videometrics, and inspection

Featuring six technical conferences


Thank you to our 2025 Optical Metrology Chairs


Marc P. Georges

Univ. de Liège (Belgium)

Jörg Seewig

Technische Univ. Kaiserslautern (Germany)