26 - 29 June 2023
Munich, Germany

Prepare your work

On this page find links to instructions, important dates, and other information for a successful week for presenters and chairs.

Why present and publish your work as part of SPIE Optical Metrology?

Here's how submitting an abstract puts a spotlight on your work:

  • Your participation in the conference gains you international visibility
  • Your research becomes a part of the world's permanent scientific record
  • Your work will be indexed in all relevant scientific databases*

Make sure that your research gets timely publication in the SPIE Digital Library.

*SPIE partners with relevant scientific databases to ensure visibility for your research, including Astrophysical Data System (ADS), Ei Compendex, CrossRef, Google Scholar, Inspec, Scopus, and Web of Science Conference Proceedings Citation Index.

It is important to start preparation of your presentation and manuscript early. Please be sure to carefully review the important dates and deadlines and read emails that you receive from SPIE. We are glad that you are interested in being a part of this dynamic program. We are here to support you in this journey from conference presentation to publication. 

Important dates

Abstracts due 8 February 2023
Authors notified and programme online 28 March 2023
Submission system opens for manuscripts and poster PDFs* 24 April 2023
Registration opens April 2023
Poster PDFs due for spie.org preview and publication 30 May 2023
Manuscripts due 7 June 2023

*Contact author or speaker must register prior to uploading

Prepare to participate