26 - 29 June 2023
Munich, Germany

An invitation to participate

Consider joining your peers at Optical Metrology in Munich in 2023

Prepare and present your latest research at the 2023 meeting


Welcome to Munich!

Take this opportunity to share your research at SPIE Optical Metrology 2023. Come to Munich to meet with users and researchers to discuss the latest inventions and applications in the field of optical metrology. The symposium will highlight new optical principles and systems for metrology, multimodal sensing, and machine vision with applications in industrial design, production engineering, process monitoring, maintenance support, biotechnology, vehicle navigation, multimedia technology, architecture, archaeology, and arts. Special emphasis is directed to model-based, remote and active approaches, sensor fusion, robot guidance, image sequence processing and scene modelling, and biomaterials  characterization, as well as to the preservation of our shared cultural heritage.

We invite engineers, scientists, researchers, trustees, and managers to attend this year’s meeting.

Co-located with Laser 2023 in Munich, Germany, this symposium will address the role of optics and lasers in the following areas:

  • Optical Measurement Systems for Industrial Inspection
  • Modeling Aspects in Optical Metrology
  • Optical Methods for Inspection, Characterization and Imaging of Biomaterials
  • Multimodal Sensing: Technologies and Applications
  • Automated Visual Inspection and Machine Vision
  • Optics for Arts, Architecture, and Archaeology

Take advantage of this unique opportunity to hear about the latest solutions to practical problems in industrial design and production engineering. Learn about recent advances in using optical technologies to preserve our shared cultural heritage. Find out about new approaches that push optical principles of measurement and testing at the macro, micro- and nanoscales to the forefront of metrology. Exchange new ideas, address your shared concerns, and get access to information not yet published in the mentioned topical areas. Share your research with other engineers, scientists, researchers, and managers. Presentations will be permanently archived in the SPIE Digital Library, and made available to others in the international scientific community who seek to learn, make discoveries, and innovate.

We invite you to join your colleagues and share the most recent developments and applications at SPIE Optical Metrology 2023.

Marc Georges

Marc P. Georges
Univ. de Liège (Belgium)

Jorg Seewig

Jörg Seewig
Technische Univ. Kaiserslautern (Germany)