San Diego Convention Center
    San Diego, California, United States
    23 - 27 August 2020
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    SPIE Optical Engineering + Applications - The premier optical design, engineering, fabrication, and instrumentation conference

    Optical Engineering + Applications

    SPIE Optical Engineering + Applications, the premier conference for the latest developments in optical design and engineering, including photonic devices and applications, x-ray, gamma-ray, and particle technologies, image and signal processing, astronomical optics and instrumentation, remote sensing, and space optical systems.

    Call for Papers (PDF 2 MB)
      View list of conferences
     Papers accepted in these areas
     • Optomechanics and Optical Manufacturing
     • Optical Design and Systems Engineering
     • Photonic Devices and Applications
     • Advanced Metrology
     • X-Ray, Gamma-Ray, and Particle Technologies
     • Signal, Image, and Data Processing
    Astronomical Optics and Instrumentation
     • Remote Sensing
     • Atmospheric and Space Optical Systems

    Special Program:

     • Special Program: Light in Nature

    SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

    The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 

    2017 Optical Engineering + Applications Executive Organizing Committee:

    Ruyan Guo, The Univ. of Texas at San Antonio (United States)
    Stephen M. Hammel, Space and Naval Warfare Systems Command (United States)
    Allen H.-L. Huang, Univ. of Wisconsin-Madison (United States)
    Khan M. Iftekharuddin, Old Dominion Univ. (United States)
    Ralph B. James, Savannah River National Lab. (United States)
    Ali M. Khounsary, Illinois Institute of Technology (United States)
    José Sasián, College of Optical Sciences, The Univ. of Arizona (United States)
    Oswald H. Siegmund, Univ. of California, Berkeley (United States)
    H. Philip Stahl, NASA Marshall Space Flight Ctr. (United States)
    Alexander M. J. van Eijk, TNO Defence, Security and Safety (Netherlands)
    Shizhuo Yin, The Pennsylvania State Univ. (United States)

    Important Author Dates

    Abstracts Due
    12 February 2020

    Acceptance Notification
    Email to Contact Author

    20 April 2020

    Manuscripts Due for
    Optical Engineering and

    29 July 2020

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