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Damage to VUV, EUV, and X-ray Optics
Editor(s): Libor Juha; Ryszard H. Sobierajski; Hubertus Wabnitz
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Volume Details

Volume Number: 6586
Date Published: 3 May 2007

Table of Contents
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Front Matter: Volume 6586
Author(s): Proceedings of SPIE
Optics challenges in 4GLS: radiation damage
Author(s): M. A. Bowler; M. D. Roper; A. J. Gleeson; F. M. Quinn; B. N. Fell; N. R. Thompson; M. A. MacDonald
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The BESSY soft x-ray FEL
Author(s): Rolf Follath
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Optics development for Japanese XFEL project
Author(s): Makina Yabashi; Atsushi Higashiya; Kenji Tamasaku; Hiroaki Kimura; Togo Kudo; Haruhiko Ohashi; Sunao Takahashi; Shunji Goto; Tetsuya Ishikawa
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State-of-the-art thin film x-ray optics for synchrotrons and FEL sources
Author(s): Frank Hertlein; Jörg Wiesmann; Carsten Michaelsen; Michael Störmer; Andreas Seifert
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Ablation of inorganic materials using laser plasma soft x-rays
Author(s): Tetsuya Makimura; Takashige Fujimori; Satoshi Uchida; Kouichi Murakami; Hiroyuki Niino
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Response of inorganic materials to laser-plasma EUV radiation focused with a lobster eye collector
Author(s): Andrzej Bartnik; Henryk Fiedorowicz; Roman Jarocki; Jerzy Kostecki; Miroslaw Szczurek; Radka Havlikova; Ladislav Pína; Libor Švéda; Adolf Inneman
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Compact EUV source and Schwarzschild objective for modification and ablation of various materials
Author(s): Frank Barkusky; Armin Bayer; Christian Peth; Holger Töttger; Klaus Mann
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Structural change in amorphous carbon on core excitations induced by soft x-ray illumination
Author(s): Koji Maeda; Shijin Liang; Yoshihisa Harada; Yoshinori Kitajima; Shik Shin; Yutaka Mera
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Capillary-discharge 46.9-nm laser-induced damage to a-C thin films exposed to multiple laser shots below single-shot damage threshold
Author(s): L. Juha; V. Hájková; J. Chalupsky; V. Vorliček; A. Ritucci; A. Reale; P. Zuppella; M. Störmer
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Radiation damage processes in complex-oxide scintillators
Author(s): Martin Nikl; Eva Mihokova; Valentin Laguta; Jan Pejchal; Stefania Baccaro; Anna Vedda
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Interaction of short and intense light pulses with matter: visible versus VUV
Author(s): S. Guizard; G. Geoffroy; J. Gaudin; M. De Grazia; B. Carré; H. Merdji; A. Belsky; N. Federov; P. Martin
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Pillars formed by laser ablation and modified by wet etching
Author(s): Kurt W. Kolasinski; Margaret E. Dudley; Barada K. Nayak; Mool C. Gupta
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Applications of intense ultra-short XUV pulses to solid state physics: time resolved luminescence spectroscopy and radiation damage studies
Author(s): M. De Grazia; H. Merdji; B. Carré; J. Gaudin; G. Geoffroy; S. Guizard; N. Fedorov; A. Belsky; P. Martin; M. Kirm; V. Babin; E. Feldbach; S. Vielhauer; V. Nagirnyi; A. Vassil'ev; F. Krejci; J. Kuba; J. Chalupsky; J. Cihelka; V. Hajkova; M. Ledinský; L. Juha
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Multilayers for next-generation x-ray sources
Author(s): S. Bajt; H. N. Chapman; E. Spiller; S. Hau-Riege; J. Alameda; A. J. Nelson; C. C. Walton; B. Kjornrattanawanich; A. Aquila; F. Dollar; E. Gullikson; C. Tarrio; S. Grantham
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Plasma-induced damage of multilayer coatings in EUVL
Author(s): R. C. Wieggers; W. J. Goedheer; E. Louis; F. Bijkerk
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Resistivity for deep-UV laser irradiation in fluorine doped silica glass fiber
Author(s): Masanori Oto
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At-wavelength diagnostics of EUV-optics
Author(s): U. Hinze; M. Fokoua; B. Chichkov
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X-ray optics power considerations for high intensity x-ray free-electron lasers based on superconducting technology
Author(s): Th. Tschentscher; H. Sinn; K. Tiedtke; H. Wabnitz
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Utilizing ablation of solids to characterize a focused soft x-ray laser beam
Author(s): J. Chalupský; L. Juha; J. Kuba; V. Hájková; J. Cihelka; P. Homer; M. Kozlová; T. Mocek; J. Polan; B. Rus; J. Krzywinsky; R. Sobierajski; H. Wabnitz; J. Feldhaus; K. Tiedtke
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Damage-resistant single-pulse optics for x-ray free electron lasers
Author(s): Stefan P. Hau-Riege; Richard A. London; Michael Bogan; Henry N. Chapman; Magnus Bergh
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Quantitative modelization of particle emission from excited solids: application to spectroscopic diagnostics of buried interfaces in multilayer
Author(s): Nicola Mahne; Angelo Giglia; Stefano Nannarone; Juri Bertoli; Valentina Mattarello; Valentino Rigato
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Debris- and radiation-induced damage effects on EUV nanolithography source collector mirror optics performance
Author(s): J. P. Allain; M. Nieto; M. Hendricks; S. S. Harilal; A. Hassanein
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Design, conception, and metrology of EUV mirrors for aggressive environments
Author(s): Christophe Hecquet; Marie-Françoise Ravet-Krill; Franck Delmotte; Arnaud Jérôme; Aurélie Hardouin; Françoise Bridou; Françoise Varnière; Marc Roulliay; Frédéric Bourcier; Jean-Michel Desmarres; Vincent Costes; Jacques Berthon; André Rinchet; Roland Geyl
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