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Proceedings Paper

Features of a laser metrology subsystem for astrometric telescopes
Author(s): Alberto Riva; Mario Gai; Mario G. Lattanzi
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Paper Abstract

In astrometric instrumentation a laser subsystem may be used for precise metrology of instrumental response. Such subsystems do not require diraction limited imaging, but can be tailored to specic application needs. We describe an interferometric arrangement for high precision monitoring of telescope line of sight and evaluate its performance as a function of some design parameters. We deduce that good sensitivity can be achieved over a signicant range of e.g. focusing conditions, provided proper cautions are adopted for detection and data processing.

Paper Details

Date Published: 17 September 2012
PDF: 7 pages
Proc. SPIE 8444, Ground-based and Airborne Telescopes IV, 84445A (17 September 2012); doi: 10.1117/12.926181
Show Author Affiliations
Alberto Riva, INAF - Osservatorio Astrofisico di Torino (Italy)
Mario Gai, INAF - Osservatorio Astrofisico di Torino (Italy)
Mario G. Lattanzi, INAF - Osservatorio Astrofisico di Torino (Italy)

Published in SPIE Proceedings Vol. 8444:
Ground-based and Airborne Telescopes IV
Larry M. Stepp; Roberto Gilmozzi; Helen J. Hall, Editor(s)

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