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Proceedings Paper

Evaluating the efficiency of a night-time, middle-range infrared sensor for applications in human detection and recognition
Author(s): Thirimachos Bourlai; John Von Dollen; Nikolaos Mavridis; Christopher Kolanko
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Paper Abstract

In law enforcement and security applications, the acquisition of face images is critical in producing key trace evidence for the successful identication of potential threats. In this work we, first, use a near infrared (NIR) sensor designed with the capability to acquire images at middle-range stand-off distances at night. Then, we determine the maximum stand-off distance where face recognition techniques can be utilized to efficiently recognize individuals at night at ranges from 30 to approximately 300 ft. The focus of the study is on establishing the maximum capabilities of the mid-range sensor to acquire good quality face images necessary for recognition. For the purpose of this study, a database in the visible (baseline) and NIR spectrum of 103 subjects is assembled and used to illustrate the challenges associated with the problem. In order to perform matching studies, we use multiple face recognition techniques and demonstrate that certain techniques are more robust in terms of recognition performance when using face images acquired at different distances. Experiments show that matching NIR face images at longer ranges (i.e. greater than about 300 feet or 90 meters using our camera system) is a very challenging problem and it requires further investigation.

Paper Details

Date Published: 18 May 2012
PDF: 12 pages
Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 83551B (18 May 2012); doi: 10.1117/12.917831
Show Author Affiliations
Thirimachos Bourlai, West Virginia Univ. (United States)
John Von Dollen, West Virginia Univ. (United States)
Nikolaos Mavridis, New York Univ. Abu Dhabi (United Arab Emirates)
Christopher Kolanko, West Virginia Univ. (United States)

Published in SPIE Proceedings Vol. 8355:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII
Gerald C. Holst; Keith A. Krapels, Editor(s)

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