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Proceedings Paper

Detection thresholds of structured noise in the presence of shot noise
Author(s): Feng Li; Brian Keelan; Robin Jenkin; Alex Dokoutchaev
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Paper Abstract

An observer study was run to determine the detection thresholds of several representative examples of column fixed pattern noise, in the presence of varying levels of shot noise, which is known to mask structured noise. The data obtained were fit well at relevant shot noise levels by a simple model based on signal detection theory. Individual metrics of fixed pattern noise and shot noise, used in the masking equation, were computed from one dimensional integrations involving the capture noise power spectra (mapped to CIELAB space); the modulation transfer function of the display; the display pixel pitch; the viewing distance; and the S-CIELAB luminance contrast sensitivity function. The results of this work can be used to predict detection thresholds that can be added to photon transfer curves for the purpose of determining whether fixed pattern noise will be visible.

Paper Details

Date Published: 24 January 2012
PDF: 10 pages
Proc. SPIE 8299, Digital Photography VIII, 82990B (24 January 2012); doi: 10.1117/12.909588
Show Author Affiliations
Feng Li, Aptina Imaging Corp. (United States)
Brian Keelan, Aptina Imaging Corp. (United States)
Robin Jenkin, Aptina Imaging Corp. (United States)
Alex Dokoutchaev, Aptina Imaging Corp. (United States)

Published in SPIE Proceedings Vol. 8299:
Digital Photography VIII
Sebastiano Battiato; Brian G. Rodricks; Nitin Sampat; Francisco H. Imai; Feng Xiao, Editor(s)

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