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Proceedings Paper

Blackbody source technology trends
Author(s): Jason A. Mazzetta; Miguel A. Medina; Stephen D. Scoptaz; John E. Sgheiza
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Paper Abstract

The infrared test equipment industry has matured over the past half century and has historically offered test equipment that met and often exceeded the capabilities of the units under test. This may seem to be a moot or trivial point. However, in the past decade infrared imagers have begun to press the limits of infrared test equipment. Today, infrared imagers incorporate focal plane arrays that offer a significantly higher resolution and sensitivity than their predecessors. Additionally, current infrared imagers are expanding their role in the field and are being developed for a wide variety of applications. These applications demand that optical infrared test equipment begin to expand their capability. Roles such as: larger emitting surface areas, temperature ranges from cryogenic to sunlight, wide ambient temperature ranges, vacuum ambient conditions, vehicle installation, field portability, computer interface compatibility, applications level software integration, and high off-axis uniformity and emissivity. Therefore, how does infrared test equipment meet these demands while maintaining excellent uniformity and stability, two of the traditionally most scrutinized specifications? This paper will present methods for achieving the rigorous demands for test equipment outlined above, it will present an outline of the development and technology trends of blackbody/infrared test equipment over the past 50 years, and finally this paper will discuss the expected development of blackbody/infrared test equipment for the years to come.

Paper Details

Date Published: 9 May 2011
PDF: 11 pages
Proc. SPIE 8014, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII, 801414 (9 May 2011); doi: 10.1117/12.884294
Show Author Affiliations
Jason A. Mazzetta, Electro Optical Industries, Inc. (United States)
Miguel A. Medina, Electro Optical Industries, Inc. (United States)
Stephen D. Scoptaz, Electro Optical Industries, Inc. (United States)
John E. Sgheiza, Electro Optical Industries, Inc. (United States)

Published in SPIE Proceedings Vol. 8014:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII
Gerald C. Holst; Keith A. Krapels, Editor(s)

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