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Proceedings Paper

MRi dual-band MWIR imaging FTS
Author(s): Florent Prel; Louis Moreau; Stéphane Lantagne; Ritchie D. Bullis; Claude Roy; Christian Vallières; Luc Levesque
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Paper Abstract

MR-i is an imaging version of the ABB Bomem MR Fourier-Transform spectroradiometer. This field instrument generates spectral datacubes in the MWIR and LWIR. It is designed to be sufficiently fast to acquire the spectral signatures of rapid events. The design is modular. The two output ports of the instrument can be populated with different combinations of detectors (imaging or not). For instance to measure over a broad spectral range, one output port can be equipped with a LWIR camera while the other port is equipped with a MWIR camera. No dichroics are used to split the bands, hence enhancing the sensitivity. Both ports can be equipped with cameras serving the same spectral range but set at different sensitivity levels in order to increase the measurement dynamic range and avoid saturation of bright parts of the scene while simultaneously obtaining good measurement of the faintest parts of the scene. Various telescope options are available for the input port. Overview of the instrument capabilities will be presented. Test results and results from field trials for a configuration with two MWIR cameras will be presented. That specific system is dedicated to the characterization of airborne targets. The two MWIR cameras are used to expand the dynamic range of the instrument and simultaneously measure the spectral signature of the cold background and of the warmest elements of the scene (flares, jet engines exhausts, etc.).

Paper Details

Date Published: 9 May 2011
PDF: 10 pages
Proc. SPIE 8014, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII, 801411 (9 May 2011); doi: 10.1117/12.883536
Show Author Affiliations
Florent Prel, ABB Analytical Measurement (Canada)
Louis Moreau, ABB Analytical Measurement (Canada)
Stéphane Lantagne, ABB Analytical Measurement (Canada)
Ritchie D. Bullis, Naval Air Warfare Ctr. Aircraft Div. (United States)
Claude Roy, ABB Analytical Measurement (Canada)
Christian Vallières, ABB Analytical Measurement (Canada)
Luc Levesque, ABB Analytical Measurement (Canada)

Published in SPIE Proceedings Vol. 8014:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII
Gerald C. Holst; Keith A. Krapels, Editor(s)

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