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Proceedings Paper

Strongly evanescent field coupling between nanofibers for sensing transverse optical force
Author(s): Jianhui Yu; Zhe Chen; Jun Zhang; Yongchun Zhong; Jieyuan Tang; Furong Huang; Yi Xiao Sr.
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Paper Abstract

Using full-vector finite element method, transverse optical forces induced by strongly evanescent coupling between two identical nanofibers is theoretically investigated. It shows that anti-symmetry and symmetry modes can induce attractive and repulsive force, respectively. When light power of the symmetry (anti-symmetry) mode at 980nm wavelength is 50mW, the gap between the nanofibers with 400nm diameter nears 392nm, the repulsive force reaches maximum (11.5 pN/μm), which results in 30nm displacement at the center of 100μm-long free-standing nanofiber. Based on pump-probe scheme, a novel potential method for optical force measurement is proposed. Using Euler-Bernoulli beam equation and coupled mode theory for waveguides, the deformation impact on the splitting ratio of coupling nanofibers is also investigated. It is found that, through the deformation, the repulsive force from 0.9 to 17 pN/μm can change the splitting ratio of coupling nanofibers from 0 to 600 when coupling length of nanofibers is fixed at 100μm, the gap is 400nm and probe light is at 808nm. It shows that measuring the splitting ratio of the strongly coupling nanofibers can potentially provide a high sensitive method for measuring the optical force.

Paper Details

Date Published: 9 November 2010
PDF: 8 pages
Proc. SPIE 7853, Advanced Sensor Systems and Applications IV, 785330 (9 November 2010); doi: 10.1117/12.870294
Show Author Affiliations
Jianhui Yu, Jinan Univ. (China)
Zhe Chen, Jinan Univ. (China)
Jun Zhang, Jinan Univ. (China)
Yongchun Zhong, Jinan Univ. (China)
Jieyuan Tang, Jinan Univ. (China)
Furong Huang, Jinan Univ. (China)
Yi Xiao Sr., Jinan Univ. (China)

Published in SPIE Proceedings Vol. 7853:
Advanced Sensor Systems and Applications IV
Brian Culshaw; Yanbiao Liao; Anbo Wang; Xiaoyi Bao; Xudong Fan; Lin Zhang, Editor(s)

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