
Proceedings Paper
Strong spatial dispersion in nanostructured multilayered metal-dielectric optical metamaterialsFormat | Member Price | Non-Member Price |
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Paper Abstract
Periodic layered metal-dielectric nanostructures are used in subwavelength imaging, invisibility cloaking, nano-lithography
and optical nanocircuitry. These optical metamaterials are usually described by local effective
medium model if their periods are much smaller than a wavelength. Our studies show that even under such
strict conditions the metamaterials are nonlocal and exhibit strong spatial dispersion effects. The uniaxial media
support two or more extraordinary waves in certain directions while the local effective model predicts only one.
The strong spatial dispersion is caused by surface plasmon polariton modes at the interfaces between metal and
dielectric layers.A
Paper Details
Date Published: 10 September 2010
PDF: 7 pages
Proc. SPIE 7754, Metamaterials: Fundamentals and Applications III, 77540E (10 September 2010); doi: 10.1117/12.860175
Published in SPIE Proceedings Vol. 7754:
Metamaterials: Fundamentals and Applications III
Allan D. Boardman; Nader Engheta; Mikhail A. Noginov; Nikolay I. Zheludev, Editor(s)
PDF: 7 pages
Proc. SPIE 7754, Metamaterials: Fundamentals and Applications III, 77540E (10 September 2010); doi: 10.1117/12.860175
Show Author Affiliations
Alexey A. Orlov, St. Petersburg State Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Alexander V. Chebykin, St. Petersburg State Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Alexander V. Chebykin, St. Petersburg State Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Pavel A. Belov, St. Petersburg State Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Queen Mary, Univ. of London (United Kingdom)
Queen Mary, Univ. of London (United Kingdom)
Published in SPIE Proceedings Vol. 7754:
Metamaterials: Fundamentals and Applications III
Allan D. Boardman; Nader Engheta; Mikhail A. Noginov; Nikolay I. Zheludev, Editor(s)
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