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Proceedings Paper

The throughput and sensitivity of the JWST mid-infrared instrument
Author(s): A. C. H. Glasse; E. Bauwens; J. Bouwman; Ö. Detre; S. Fischer; M. Garcia-Marin; K. Justannont; A. Labiano; T. Nakos; M. Ressler; G. Rieke; S. Scheithauer; M. Wells; G. S. Wright
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Paper Abstract

The Verification Model (VM) of MIRI has recently completed an extensive programme of cryogenic testing, with the Flight Model (FM) now being assembled and made ready to begin performance testing in the next few months. By combining those VM test results which relate to MIRI's scientific performance with measurements made on FM components and sub-assemblies, we have been able to refine and develop the existing model of the instrument's throughput and sensitivity. We present the main components of the model, its correlation with the existing test results and its predictions for MIRI's performance on orbit.

Paper Details

Date Published: 4 August 2010
PDF: 11 pages
Proc. SPIE 7731, Space Telescopes and Instrumentation 2010: Optical, Infrared, and Millimeter Wave, 77310K (4 August 2010); doi: 10.1117/12.856975
Show Author Affiliations
A. C. H. Glasse, UK Astronomy Technology Ctr. (United Kingdom)
E. Bauwens, Instituut voor Sterrenkunde, Katholieke Univ. Leuven (Belgium)
J. Bouwman, Max-Planck-Institut für Astronomie (Germany)
Ö. Detre, Max-Planck-Institut für Astronomie (Germany)
S. Fischer, Univ. zu Köln (Germany)
M. Garcia-Marin, Univ. zu Köln (Germany)
K. Justannont, Onsala Space Observatory, Chalmers Univ. of Technology (Sweden)
A. Labiano, European Space Agency (Spain)
T. Nakos, Sterrenkundig Observatorium, Univ. Gent (Belgium)
M. Ressler, Jet Propulsion Lab. (United States)
G. Rieke, Steward Observatory, The Univ. of Arizona (United States)
S. Scheithauer, Max-Planck-Institut für Astronomie (Germany)
M. Wells, UK Astronomy Technology Ctr. (United Kingdom)
G. S. Wright, UK Astronomy Technology Ctr. (United Kingdom)

Published in SPIE Proceedings Vol. 7731:
Space Telescopes and Instrumentation 2010: Optical, Infrared, and Millimeter Wave
Jacobus M. Oschmann Jr.; Mark C. Clampin; Howard A. MacEwen, Editor(s)

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