Share Email Print

Proceedings Paper

Method of detectors offset correction in thermovision camera with uncooled microbolometric focal plane array
Author(s): Grzegorz Bieszczad; Tomasz Orżanowski; Tomasz Sosnowski; Mariusz Kastek
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A microbolometer is an uncooled thermal sensor of infra-red radiation. In thermal imaging, microbolometers organized in arrays called focal plane arrays (FPA) are used. Because of technological process microbolometric FPAs features unwanted detector gain and offset nonuniformity. Because of that, the detector matrix, being exposed to uniform infrared radiation produces nonuniform image with superimposed fixed pattern noise (FPN). To eliminate FPN, nonuniformity correction (NUC) algorithms are used. The offset of detector in array depends from mean temperature of FPA. Every single detector in matrix has its temperature drift, so the characteristic of every detector changes over temperature. To overpass this problem, a temperature stabilization of FPA is commonly used, however temperature stabilization is a relatively power demanding process. In this article a method of offset calculation and correction for every detector in array in function of mean array temperature is described. The method of offset temperature characteristic estimation is shown. The elaborated method let to use unstabilized microbolometric focal plane array in thermographic camera. Method of offset correction was evaluated for amorphous silicon based UL 03 04 1 detector array form ULIS.

Paper Details

Date Published: 23 September 2009
PDF: 8 pages
Proc. SPIE 7481, Electro-Optical and Infrared Systems: Technology and Applications VI, 74810O (23 September 2009); doi: 10.1117/12.830678
Show Author Affiliations
Grzegorz Bieszczad, Military Univ. of Technology (Poland)
Tomasz Orżanowski, Military Univ. of Technology (Poland)
Tomasz Sosnowski, Military Univ. of Technology (Poland)
Mariusz Kastek, Military Univ. of Technology (Poland)

Published in SPIE Proceedings Vol. 7481:
Electro-Optical and Infrared Systems: Technology and Applications VI
David A. Huckridge; Reinhard R. Ebert, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?