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Proceedings Paper

Laser damage densities measurements on fused silica optics: round-robin test at 351-355 nm
Author(s): Laurent Lamaignère; Marc Loiseau; Thierry Donval; Roger Courchinoux; Stéphane Bouillet; Jean-Christophe Poncetta; Bertrand Bertussi; Hervé Bercegol
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Paper Abstract

A rasterscan test procedure [L. Lamaignère et al, Rev. Sci. Instrumen. 78, 103105 (2007)] has been implemented in order to determine low laser damage density of large aperture UV fused silica optics. This procedure was improved in terms of accuracy and repeatability. Tests have been carried on several facilities using several pulse durations and spatial distributions. We describe the equipment, test procedure and data analysis to perform this damage test with small beams (Gaussian beams, about 1mm @ 1/e, and top hat beams). Then, beam overlap and beam shape are the two key parameters which are taken into account in order to determine damage density. After data analysis and treatment, a repeatable metrology has been obtained. Moreover, the consideration of error bars on defects distributions permits to compare data between these installations. This allows us to reach reproducibility, a necessary condition in order to share results and to make reliable predictions of laser damage resistance.

Paper Details

Date Published: 18 May 2009
PDF: 7 pages
Proc. SPIE 7361, Damage to VUV, EUV, and X-Ray Optics II, 73610M (18 May 2009); doi: 10.1117/12.820580
Show Author Affiliations
Laurent Lamaignère, Commissariat à l'Energie Atomique (France)
Marc Loiseau, Commissariat à l'Energie Atomique (France)
Thierry Donval, Commissariat à l'Energie Atomique (France)
Roger Courchinoux, Commissariat à l'Energie Atomique (France)
Stéphane Bouillet, Commissariat à l'Energie Atomique (France)
Jean-Christophe Poncetta, Commissariat à l'Energie Atomique (France)
Bertrand Bertussi, Commissariat à l'Energie Atomique (France)
Hervé Bercegol, Commissariat à l'Energie Atomique (France)

Published in SPIE Proceedings Vol. 7361:
Damage to VUV, EUV, and X-Ray Optics II
Libor Juha; Saša Bajt; Ryszard Sobierajski, Editor(s)

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