Share Email Print

Proceedings Paper

Evaluation of the additive noise of a flat panel detector and its effect on cone-beam CT applications
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Cone-beam systems designed for breast cancer detection bear a unique radiation dose limitation and are vulnerable to the additive noise from the detector. Additive noise is the signal fluctuation from detector elements and is independent of the incident exposure level. In this study, two different approaches (single pixel based and region of interest based) to measure the additive noise were explored using continuously acquired air images at different exposure levels, with both raw images and flat-field corrected images. The influence from two major factors, inter-pixel variance and image lag, were studied. The pixel variance measured from dark images was used as the gold standard (for the entire detector 15.12±1.3 ADU2) for comparison. Image noise propagation through reconstruction procedures was also investigated and a mathematically derived quadratic relationship between the image noise and the inverse of the radiation dose was confirmed with experiment data. The additive noise level was proved to affect the CT image noise as the second order coefficient and thus determines the lower limit of the scan radiation dose, above which the scanner operates at quantum limited region and utilizes the x-ray photon most efficiently.

Paper Details

Date Published: 10 March 2009
PDF: 8 pages
Proc. SPIE 7258, Medical Imaging 2009: Physics of Medical Imaging, 725806 (10 March 2009); doi: 10.1117/12.813563
Show Author Affiliations
Kai Yang, Univ. of California, Davis (United States)
Shih-Ying C. Huang, Univ. of California, Davis (United States)
Nathan J. Packard, Univ. of California, Davis (United States)
John M. Boone, Univ. of California, Davis (United States)

Published in SPIE Proceedings Vol. 7258:
Medical Imaging 2009: Physics of Medical Imaging
Ehsan Samei; Jiang Hsieh, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?