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Proceedings Paper

Three-dimensional x-ray diffraction nanoscopy
Author(s): Andrei Y. Nikulin; Ruben A. Dilanian; Nadia A. Zatsepin; Barry C. Muddle
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Paper Abstract

A novel approach to x-ray diffraction data analysis for non-destructive determination of the shape of nanoscale particles and clusters in three-dimensions is illustrated with representative examples of composite nanostructures. The technique is insensitive to the x-rays coherence, which allows 3D reconstruction of a modal image without tomographic synthesis and in-situ analysis of large (over a several cubic millimeters) volume of material with a spatial resolution of few nanometers, rendering the approach suitable for laboratory facilities.

Paper Details

Date Published: 9 September 2008
PDF: 10 pages
Proc. SPIE 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II, 70420H (9 September 2008); doi: 10.1117/12.795955
Show Author Affiliations
Andrei Y. Nikulin, Monash Univ. (Australia)
Ruben A. Dilanian, Monash Univ. (Australia)
Nadia A. Zatsepin, Monash Univ. (Australia)
Barry C. Muddle, Monash Univ. (Australia)

Published in SPIE Proceedings Vol. 7042:
Instrumentation, Metrology, and Standards for Nanomanufacturing II
Michael T. Postek; John A. Allgair, Editor(s)

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