Share Email Print

Proceedings Paper

Ultra low capacitance high frequency IC probe
Author(s): M. E. Jacob; D. A. Miller; L. Forbes
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The high speed low capacitance probe presented here is a flexible / tailorable tool for internal node testing on Radio Frequency Integrated Circuits (RFIC). The probe utilizes the mutual capacitive coupling between two wires. In this case, a tungsten whisker and the inner conductor of a coaxial cable forms a capacitor, enabling extremely low probing (loading) capacitance. The mutual capacitance which can be modeled to the first order as a lumped element capacitor provides differentiating action. Viewing the derivative of the output signal, rise time and can be observed directly. Through the use of probe calibration and Fourier transforms the probed signal can be re-created. Probe calibration develops a transfer function enabling re-creation of time domain signals.

Paper Details

Date Published: 9 September 2008
PDF: 9 pages
Proc. SPIE 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II, 704203 (9 September 2008); doi: 10.1117/12.792137
Show Author Affiliations
M. E. Jacob, Oregon State Univ. (United States)
D. A. Miller, Oregon State Univ. (United States)
L. Forbes, Oregon State Univ. (United States)

Published in SPIE Proceedings Vol. 7042:
Instrumentation, Metrology, and Standards for Nanomanufacturing II
Michael T. Postek; John A. Allgair, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?